The Pinnacle is ideal for measurement of small, close tolerance parts, particularly parts with a high density of features, such as hard disk drive suspensions, printer heads, precision stampings, leadframes, ball-grid arrays, and chip scale packages.

The Pinnacle can be equipped with an optional through-the-lens or offset mounted laser for added flexibility in Z-axis measurements. Pinnacle models can also utilize the optional SpectraProbe™ offering sub-micron Z-axis measurement resolution.

The Pinnacle operates with one or more of VIEW's standard metrology software packages:

• VIEW Metrology Software (VMS™) which offers a wide array of standard measurement tools as well as a built-in scripting language to enable custom-functions.

• Elements® CAD-to-Measure software provides automatic translation of 2-D CAD files in measurement programs, enabling very fast set-up of measurement routines for even the most complex parts.

• 	Standard	Optional
  X,Y,Z Travel	250x150x100 mm
  Load Capacity	25 kg
  Imaging Optics	Dual magnification, fixed lens optics with field interchangeable front lens. VIEW 2.5X front lens included as standard. Low mag has 1:1 with front lens; high mag has 4:1 with front lens.	Single magnification, fixed lens optics with factory configurable back tube and field interchangeable front lens. VIEW 1X back tube and 2.5X front lens included as standard.
  Metrology Camera	1.4 megapixel, 1/2 inch, digital monochrome	1.4 megapixel, 2/3 inch, digital, monochrome 2.0 megapixel 1/2 inch, digital monochrome
  Illumination	All LED coaxial through-the-lens surface light and below-the-stage back light	Multi-color programmable ring light Grid autofocus system
  Sensor Options		Through-the-lens (TTL) laser Spectra Probe white light range sensor Off-axis triangulation laser
  Measurement Modes	High Speed Move and Measure (MAM)	Continuous Image Capture (CIC)